Time-resolved microscopy and model-based analysis

Figure 1: Physical ablation effects in laser thin film processing as a function of the ratio of effective penetration depth to layer thickness d. The effective penetration depth is determined by thermal and optical penetration depth. The direct (b) and the directly induced (a) ablation of thin metal films had been described in detail in the literature, the partially induced (c) and the indirectly induced (d) ablation of (partially) transparent thin films are part of the project.

Figure 2: Project outline distributing the workload to its respective partners. Furthermore, the assignment of the experimentally determined input parameters for the different parts of the multi-scale model is schematically shown.
  • RWTH Aachen University, Prof. Wolfgang Schulz, Lehr- und Forschungsgebiet Nichtlineare Dynamik der Laserfertigungsverfahren NLD,
  • RWTH Aachen University, Dr.-Ing. Arnold Gillner, Lehrstuhl für Lasertechnik LLT

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Prof. Dr. Heinz P. Huber Room: A 211

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